Redux AFM

Both the Redux and nGauge systems use our AFM-on-a-chip technology to make nanoscale imaging effortless.

The Redux has a higher level of automation, combining an integrated optical microscope and motorized XY stage controls, and it also has a sample platform that can accommodate larger samples.

The Redux is so fast and streamlined because of the built-in sensors and scanners that are part of the system.

The Redux offers unmatched ease of use. There is no laser alignment and all the set-up steps have been automated.

Watch the full demo video above and see for yourself what Redux operation is like.

Yes, the nGauge and Redux can use the same AFM chips. If you already have one of the systems, you can use the chips you already have.

For most samples, yes: there is very little sample preparation required for most samples. Transparent or opaque, conductive or non-conductive, adhesive or not, they can all be scanned. Scanning curved samples is no issue as well since any curvature usually does not show up on the micron length scale.

It’s important that the sample does not move during scanning. For lightweight samples like foils, paper, and for flexible or round samples that could roll (such as single fibers, wire, hair), we recommend affixing them to a substrate (glass slide, mica disc) with adhesive.

Yes, round or cylindrical samples are not a problem. Even very thin wires or fibers can be scanned.

In general, yes. The reason is that even if the morphology across the sample shows high variation (for example, 50 micron), within the relatively small lateral scan area of the AFM, the variation will typically never reach those levels.

The Redux sample stage is motorized in X, Y and Z, and controlled through the operating software.

We strongly recommend using a vibration isolation table to reduce noise and get optimal results. We offer passive and active vibration isolation tables, specifically selected for the Redux.

We strongly recommend using an acoustic enclosure to reduce environmental noise for optimal performance. We offer an acoustic enclosure designed for the Redux.

The Redux does not currently support scanning liquid samples.

Yes. AFM is the highest resolution technique for roughness. It is also capable of scanning larger roughness in the micron range.

The Redux operates in intermittent contact mode (tapping mode) and collects topography and phase images.

The Redux does not currently collect force-distance curves.

Yes. The Redux is compact and can be set up in a glove box.

The Redux lid can be easily removed to make accessing the system easier inside a glove box.

The Redux does not currently support in-vacuum operation and is meant for operation in ambient conditions.

The Redux offers unmatched ease-of-use for AFM systems: it’s as easy to use as an optical microscope. Watch the demo video above to see what to expect with operation.