AFM for Education

Why teach atomic force microscopy?

Atomic Force Microscopy (AFM) is a versatile technique for micro- and nanoscale characterization. AFM is an imaging technique that can collect high-resolution 3D images of virtually any solid sample. In academic, government, and corporate research, AFM is used for fundamental research, applied research and product development. The semiconductor and display industries rely on AFM for quality control in manufacturing environments.

Teaching AFM prepares your students for STEM careers in academia, research and industry. Departments such as physics, chemistry, biology, material science, chemical engineering, and nanotechnology engineering, among many others, frequently include AFM as part of the curriculum and many offer hands-on teaching labs for AFM. AFM is an exciting technique where students can see samples in 3D and at the nanoscale.

What types of samples can the students scan with AFM?

Virtually any solid sample can be scanned with atomic force microscopy, even non-conductive and transparent samples. 

Physics, Electrical Engineering, and Nanotechnology

  • Optical media (DVD, Blu-ray)
  • Optics (mirrors, metasurfaces)
  • Semiconductors (microfabricated structures)
  • Display materials
  • Ceramic materials

Chemistry, Chemical Engineering and Materials Science

  • Polymers and composites
  • Nanoparticles 
  • Catalysts
  • Ceramics
  • Metals (corrosion)
  • Metal-organic frameworks
  • Battery materials
Microfabricated silicon grating
silica polymer phase high res
Phase image of silica-polymer composite

Mechanical engineering, precision engineering and machining

  • Metals
  • Polymers and composites
  • Glasses
  • Ceramics
  • Machining tools (bits, blades)

Biology and Biological Engineering

  • Skin cells
  • Sera
  • Bacteria
  • Viruses
  • Fungi
  • Proteins
  • Extracellular vesicles
3d scan - titanium alloy no bg
Titanium-aluminum alloy with mirror finish
Skin cells with keratin filaments

The nGauge AFM for education

ICSPI’s AFM systems like the nGauge AFM are ideal as a first step for undergraduate, graduate and high school students. The nGauge can be set up and scanning within minutes, allowing the instructor and students to avoid complex configuration and maximizing hands-on time with the instrument. Our AFM systems are also used for independent research projects by upper year undergraduate students. 

 

Key benefits of the nGauge

  • Fastest time-to-data: students can get started with imaging in minutes
  • Fast learning curve: no previous AFM experience is required. Collect scans in just three clicks.
  • Compact: the nGauge system takes up less than 1 square foot of space
  • Affordable: base models start at under $19,000 USD
  • Hassle-free: designed to be robust, no service contracts and minimal maintenance
  • No special requirements: each system comes with everything needed to scan. Just connect the system to USB and regular power.
nGauge atomic force microscope on a wet lab bench with optical microscope accessory.
nGauge AFM being used in a physics class

Watch a live demonstration of the nGauge AFM

The nGauge AFM is used to make nanoscale discoveries on the material science YouTube channel Breaking Taps

Frequently Asked Questions

Our AFM systems are designed for simplicity and can be ready for use in minutes after unboxing. You just need access to regular power and USB on a Windows PC.

Our AFM systems are designed to be hassle-free. There are no service contracts required and because the number of parts is minimized, there is virtually no maintenance required on the systems.

Our AFMs are designed for easy integration with commercial computer systems. Each AFM includes proprietary software that can be easily installed on any standard computer. To connect the AFM system to your computer, we provide USB cables that facilitate quick and hassle-free setup. Our AFMs are powered by a standard wall outlet, and we include both the power cable and the necessary adapter with each unit.

There are no additional special hardware requirements.

Yes, students can perform scans themselves. Our Atomic Force Microscopy (AFM) systems are designed with user-friendliness in mind, making them accessible even to beginners. Being MEMS-based, our systems eliminate the need for complex laser alignment, which is commonly required in other types of AFMs.

The intuitive interface guides users through the setup and scanning process step-by-step. Additionally, each system comes with comprehensive training materials, including guides for quick start and data analysis, which are specifically tailored to help students grasp the fundamentals of AFM operation quickly. Moreover, scans can be completed in just a few minutes, allowing students to conduct multiple experiments in a single lab session and observe results in real-time, enhancing their learning experience.

Our AFM chips are robust, durable, and easy to handle. Under normal use conditions, each AFM chip can be used for up to thousands of scans.

For more information, please check out our page on our AFM chip technology.

An optical microscope is integrated directly into the design of our Redux AFM allowing for easy scan site selection.

An optical microscope accessory can be optionally included with the purchase of the nGauge AFM.

For our AFM systems, the need for a vibration isolation table depends on the specific model you choose.

Our nGauge model is designed to operate effectively without the need for a vibration isolation table, thanks to its lightweight design that minimizes sensitivity to environmental vibrations. This makes it ideal for educational purposes or environments where such specialized equipment is not available.

On the other hand, while our Redux model can perform scans without a vibration isolation table, we recommend using a vibration isolation table and an acoustic enclosure for optimal performance. We offer both of these accessories. The vibration isolation table provides excellent stability and precision without requiring electrical power or an air hookup, making it convenient and effective for enhancing the quality of high-resolution scans.

Yes, our AFM systems are ideal for high school settings. The simplicity of our designs means that students can operate the systems with minimal technical knowledge. Each AFM features user-friendly software that guides students through the process, fostering an environment where they can learn and apply principles of nanoscience safely and independently. Moreover, our systems include educational materials tailored to help both students and teachers quickly grasp key concepts of atomic force microscopy, making it a practical tool for scientific education at the high school level.

Yes, our AFM systems are highly suitable for independent research projects. They are designed with safety and simplicity in mind, ensuring that they do not require extensive technical training to operate and are hassle-free.  Our AFMs provide robust and reliable functionality that supports a wide range of applications, from material science to biological research.

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Interested to learn more about how you can get started teaching AFM?

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