Introducing the Redux AFM
Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux atomic force microscope. Collect quantitative data in minutes for topography, roughness, film thickness, particle size and more.
Effortless nanoscale imaging
Powerful
Quantitative 3D data with sub-nanometer precision
Fast
Go from sample loading to data in minutes
Automated
One-click configuration and no laser alignment
Versatile
Topography, roughness, thickness, particle size and more
One technique. Many solutions.
Make better decisions — faster — with quantitative 3D nanoscale data.
Effortless nanoscale imaging on any benchtop
See how the nGauge AFM is used to make nanoscale discoveries
on the material science channel Breaking Taps
on the material science channel Breaking Taps
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Trusted by scientists, engineers and educators worldwide
We have been blown away by the nGauge AFM’s performance, ease-of-use and portability. The tool easily saves us several thousand dollars a month.
This technology is extremely reliable and can provide images that rival much larger, traditional AFM systems.
The nGauge allows us to accurately measure the thickness of our nanoscale diffractive optics. We have increased our yield and it has helped characterize our devices.
I get numerical data instead of just an idea based on the picture using optical microscopy. That is really helpful for us in formulating our suspensions.